The SORCE XPS Level 4 Solar Spectral Irradiance 0.1nm Res 24-Hour Means product (SOR4XPSD_HIGH) contains modelled spectral extreme ultraviolet (XUV) irradiances based on calibrated SORCE XUV Photometer System (XPS) data and flare plasma temperature derived from the GOES XRS instrument. The model data are reported in the spectral range from 0-40 nm at a resolution of 0.1 nm (high res) and averaged over a day. The XPS Level 2 data products, along with CHIANTI reference spectra, are used to construct the XPS Level 4 data products.
The SOR4XPSD_HIGH data are stored in netCDF files containing data for the entire mission. Data variables stored in the file include:
MODELFLUX: Array of solar irradiances [W/m2/nm] in 0.1 nm bins from 0.1 to 39.9 nm
ERR_ABS: Total combined standard uncertainty of the model flux irradiance results (accuracy)
ERR_MEAS: Count-rate based combined standard uncertainty of the XPS-1,-2 measurement (precision)
DATE: Year and day-of-year of observation (YYDDD)
TIME: Seconds of day for middle of observation
XPS_QS: Daily quiet-sun scale factor derived from XPS-1,-2 daily minimum
XPS_AR: Daily active-region scale factor derived from XPS-1,-2 daily minimum
XPS_FLARE: Flare scale factor for each XPS-1,-2
GOES_QS: Daily quiet-sun scale factor derived from GOES XRS-B daily minimum
GOES_AR: Daily active-region scale factor derived from GOES XRS-B daily minimum
GOES_FLARE: Flare scale factor for each GOES XRS-B integration
FMTEMP: Flare model temperature [log10(K)] derived from ratio of GOES XRS-B to XRS-A
FMINDEX: Index into flare model table
FMWEIGHT: Weight parameter for the flare model