IGBT accelerated aging data set.

Preliminary data from thermal overstress accelerated aging using the aging and characterization system. The data set contains aging data from 6 devices, one device aged with DC gate bias and the rest aged with a squared signal gate bias. Several variables are recorded and in some cases, high-speed measurements of gate voltage, collector-emitter voltage and collector current are available. The data set is provided by the Prognostics CoE at NASA Ames.

Data and Resources

This dataset has no data

Additional Info

Field	Value
Maintainer	Nikunj Oza
Last Updated	July 17, 2025, 14:08 (UTC)
Created	March 31, 2025, 13:10 (UTC)
accessLevel	public
accrualPeriodicity	irregular
bureauCode	{026:00}
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harvest_object_id	6b8da549-fa87-4266-8b58-5dc816b33598
harvest_source_id	61638e72-b36c-4866-9d28-551a3062f158
harvest_source_title	DNG Legacy Data
identifier	DASHLINK_134
issued	2010-09-13
landingPage	https://c3.nasa.gov/dashlink/resources/134/
modified	2020-01-29
programCode	{026:029}
publisher	Dashlink
resource-type	Dataset
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