AVIRIS-5 L2A Orthocorrected Surface Reflectance, Facility Instrument Collection

This dataset contains Level 2A (L2A) surface reflectance images from the Airborne Visible / Infrared Imaging Spectrometer-5 (AVIRIS-5) instrument. This is the NASA Earth Observing System Data and Information System (EOSDIS) facility instrument archive of these data. The NASA AVIRIS-5 is a spectral mapping system that measures reflected radiance at 5-nm intervals in the Visible to Shortwave Infrared (VSWIR) spectral range from 380-2500 nm. The AVIRIS-5 sensor has a 40-degree instantaneous field of view with 1239 pixels, providing altitude dependent ground sampling distances from 12 m to sub meter range. This spectrometer measures radiance from surface and atmosphere and is extremely similar in design to the orbital Earth Surface Mineral Dust Source Investigation (EMIT) spectrometer. Surface hemispherical directional reflectance was derived from calibrated radiance using an optimal estimation algorithm. For each flight line, two file types are included: orthocorrected surface reflectance (RFL_ORT) and orthocorrected reflectance uncertainty (UNC_ORT) in netCDF format. Both file types include data projected in a UTM coordinate system. In addition, ancillary files for each flight line are provided, including a quick look image in GeoTIFF format and text files in YAML format that document processing algorithms and parameters used during production. AVIRIS-5 supports NASA Science and applications in many areas including plant composition and function, geology and soils, wetlands and aquatic ecosystems, greenhouse gas mapping, and calibration of orbital platforms.