@prefix dcat: <http://www.w3.org/ns/dcat#> .
@prefix dct: <http://purl.org/dc/terms/> .
@prefix foaf: <http://xmlns.com/foaf/0.1/> .
@prefix org: <http://www.w3.org/ns/org#> .
@prefix skos: <http://www.w3.org/2004/02/skos/core#> .
@prefix vcard: <http://www.w3.org/2006/vcard/ns#> .
@prefix xsd: <http://www.w3.org/2001/XMLSchema#> .

<https://data.nasa.gov/dataset/d5b2c033-47d6-47b8-985d-c3696f8088c5> a dcat:Dataset ;
    dct:description """The prognostic technique for a power MOSFET presented\r
in this paper is based on accelerated aging of MOSFET\r
IRF520Npbf in a TO-220 package. The methodology utilizes\r
thermal and power cycling to accelerate the life of the devices.\r
The major failure mechanism for the stress conditions is die attachment\r
degradation, typical for discrete devices with lead free\r
solder die attachment. It has been determined that die attach\r
degradation results in an increase in ON-state resistance\r
due to its dependence on junction temperature. Increasing\r
resistance, thus, can be used as a precursor of failure for the\r
die-attach failure mechanism under thermal stress. A feature\r
based on normalized ON-resistance is computed from in-situ\r
measurements of the electro-thermal response. An Extended\r
Kalman filter is used as a model-based prognostics techniques\r
based on the Bayesian tracking framework.""" ;
    dct:identifier "DASHLINK_857" ;
    dct:issued "2013-12-12"^^xsd:date ;
    dct:modified "2020-01-29"^^xsd:date ;
    dct:publisher <https://data.nasa.gov/organization/dbb294e4-8597-44f5-aaf4-c0baac12cdbc> ;
    dct:title "Prognostics Approach For Power Mosfet Under Thermal-Stress Aging" ;
    dcat:contactPoint [ a vcard:Organization ;
            vcard:fn "Jose Celaya Galvan" ;
            vcard:hasEmail <mailto:jose.r.celayagalvan@nasa.gov> ] ;
    dcat:distribution <https://data.nasa.gov/dataset/d5b2c033-47d6-47b8-985d-c3696f8088c5/resource/5fb5ac3b-fdf6-421f-96c0-68c057fab445> ;
    dcat:keyword "ames",
        "dashlink",
        "nasa" .

<https://data.nasa.gov/dataset/d5b2c033-47d6-47b8-985d-c3696f8088c5/resource/5fb5ac3b-fdf6-421f-96c0-68c057fab445> a dcat:Distribution ;
    dct:description "Full paper PDF" ;
    dct:format "PDF" ;
    dct:identifier "5fb5ac3b-fdf6-421f-96c0-68c057fab445" ;
    dct:issued "2025-03-31T20:51:47.394548"^^xsd:dateTime ;
    dct:modified "2025-03-31T20:51:47.382637"^^xsd:dateTime ;
    dct:title "RAMS-12 MOSFET Final.pdf" ;
    dcat:accessURL <https://c3.nasa.gov/dashlink/static/media/publication/RAMS-12_MOSFET_Final.pdf> ;
    dcat:mediaType "application/pdf" .

<https://data.nasa.gov/organization/dbb294e4-8597-44f5-aaf4-c0baac12cdbc> a org:Organization ;
    skos:prefLabel "NASA" ;
    foaf:name "NASA" .