@prefix dcat: <http://www.w3.org/ns/dcat#> .
@prefix dct: <http://purl.org/dc/terms/> .
@prefix foaf: <http://xmlns.com/foaf/0.1/> .
@prefix org: <http://www.w3.org/ns/org#> .
@prefix skos: <http://www.w3.org/2004/02/skos/core#> .
@prefix vcard: <http://www.w3.org/2006/vcard/ns#> .
@prefix xsd: <http://www.w3.org/2001/XMLSchema#> .

<https://data.nasa.gov/dataset/c60bcf9d-53b7-4fc1-becd-40eace8cc9a2> a dcat:Dataset ;
    dct:description "Data from capacitors subjected to electrical stress at 10V." ;
    dct:identifier <https://data.nasa.gov/api/views/y939-maf8> ;
    dct:issued "2023-11-02"^^xsd:date ;
    dct:modified "2023-11-02"^^xsd:date ;
    dct:publisher <https://data.nasa.gov/organization/dbb294e4-8597-44f5-aaf4-c0baac12cdbc> ;
    dct:title "Capacitor Electrical Stress-2" ;
    dcat:contactPoint [ a vcard:Organization ;
            vcard:fn "Chetan Kulkarni" ;
            vcard:hasEmail <mailto:chetan.s.kulkarni@nasa.gov> ] ;
    dcat:distribution <https://data.nasa.gov/dataset/c60bcf9d-53b7-4fc1-becd-40eace8cc9a2/resource/693f4adc-e94a-4bef-b54b-cff67831eeb1> ;
    dcat:keyword "degradation",
        "diagnostics",
        "electronics",
        "phm",
        "prognostics" ;
    dcat:theme <%7B%22Raw%20Data%22%7D> .

<https://data.nasa.gov/dataset/c60bcf9d-53b7-4fc1-becd-40eace8cc9a2/resource/693f4adc-e94a-4bef-b54b-cff67831eeb1> a dcat:Distribution ;
    dct:format "ZIP" ;
    dct:identifier "693f4adc-e94a-4bef-b54b-cff67831eeb1" ;
    dct:issued "2025-05-29T20:35:19.500073"^^xsd:dateTime ;
    dct:modified "2025-05-29T20:35:19.486470"^^xsd:dateTime ;
    dct:title "EOS_DataSet.zip" ;
    dcat:accessURL <https://data.nasa.gov/docs/legacy/EOS_DataSet.zip> ;
    dcat:mediaType "application/zip" .

<https://data.nasa.gov/organization/dbb294e4-8597-44f5-aaf4-c0baac12cdbc> a org:Organization ;
    skos:prefLabel "NASA" ;
    foaf:name "NASA" .