@prefix dcat: <http://www.w3.org/ns/dcat#> .
@prefix dct: <http://purl.org/dc/terms/> .
@prefix foaf: <http://xmlns.com/foaf/0.1/> .
@prefix org: <http://www.w3.org/ns/org#> .
@prefix skos: <http://www.w3.org/2004/02/skos/core#> .
@prefix vcard: <http://www.w3.org/2006/vcard/ns#> .
@prefix xsd: <http://www.w3.org/2001/XMLSchema#> .

<https://data.nasa.gov/dataset/be89359f-18f8-42a1-bc33-faa242d84787> a dcat:Dataset ;
    dct:description "Precursor parameters have been identified to enable development of a prognostic approach for insulated gate bipolar transistors (IGBT). The IGBT were subjected to thermal overstress tests using a transistor test board until device latch-up. The collector-emitter current, transistor case temperature, transient and steady state gate voltages, and transient and steady state collector-emitter voltages were monitored in-situ during the test. Pre- and post-aging characterization tests were performed on the IGBT. The aged parts were observed to have shifts in capaci- tance-voltage (C-V) measurements as a result of trapped charge in the gate oxide. The collector-emitter ON voltage V_CE(ON) showed a reduction with aging. The reduction in the V_CE(ON) was found to be correlated to die attach degradation, as observed by scan- ning acoustic microscopy (SAM) analysis. The collector-emitter voltage, and transistor turn-off time were observed to be precursor parameters to latch-up. The monitoring of these precursor parameters will enable the development of a prognostic methodology for IGBT failure. The prognostic methodology will involve trending precursor data, and using physics of failure models for prediction of the remaining useful life of these devices." ;
    dct:identifier "DASHLINK_895" ;
    dct:issued "2014-01-16"^^xsd:date ;
    dct:modified "2020-01-29"^^xsd:date ;
    dct:publisher <https://data.nasa.gov/organization/dbb294e4-8597-44f5-aaf4-c0baac12cdbc> ;
    dct:title "Precursor Parameter Identification for Insulated Gate Bipolar Transistor (IGBT) Prognostics" ;
    dcat:contactPoint [ a vcard:Organization ;
            vcard:fn "Jose Celaya Galvan" ;
            vcard:hasEmail <mailto:jose.r.celayagalvan@nasa.gov> ] ;
    dcat:distribution <https://data.nasa.gov/dataset/be89359f-18f8-42a1-bc33-faa242d84787/resource/8fa6a797-f2c3-4f66-8d39-c759e84724de> ;
    dcat:keyword "ames",
        "dashlink",
        "nasa" .

<https://data.nasa.gov/dataset/be89359f-18f8-42a1-bc33-faa242d84787/resource/8fa6a797-f2c3-4f66-8d39-c759e84724de> a dcat:Distribution ;
    dct:description "Full paper PDF" ;
    dct:format "PDF" ;
    dct:identifier "8fa6a797-f2c3-4f66-8d39-c759e84724de" ;
    dct:issued "2025-03-31T23:02:45.587540"^^xsd:dateTime ;
    dct:modified "2025-03-31T23:02:45.576074"^^xsd:dateTime ;
    dct:title "04967915.pdf" ;
    dcat:accessURL <https://c3.nasa.gov/dashlink/static/media/publication/04967915.pdf> ;
    dcat:mediaType "application/pdf" .

<https://data.nasa.gov/organization/dbb294e4-8597-44f5-aaf4-c0baac12cdbc> a org:Organization ;
    skos:prefLabel "NASA" ;
    foaf:name "NASA" .